Identification of wood defect using pattern recognition technique

(1) * Teo Hong Chun Mail (Department of Information Technology and Communication, Politeknik Mersing, Malaysia)
(2) Ummi Raba'ah Hashim Mail (Centre for Advanced Computing Technology, Universiti Teknikal Malaysia Melaka (UTeM), Malaysia)
(3) Sabrina Ahmad Mail (Centre for Advanced Computing Technology, Universiti Teknikal Malaysia Melaka (UTeM), Malaysia)
(4) Lizawati Salahuddin Mail (Centre for Advanced Computing Technology, Universiti Teknikal Malaysia Melaka (UTeM), Malaysia)
(5) Ngo Hea Choon Mail (Centre for Advanced Computing Technology, Universiti Teknikal Malaysia Melaka (UTeM), Malaysia)
(6) Kasturi Kanchymalay Mail (Centre for Advanced Computing Technology, Universiti Teknikal Malaysia Melaka (UTeM), Malaysia)
(7) Nur Haslinda Ismail Mail (Centre for Advanced Computing Technology, Universiti Teknikal Malaysia Melaka (UTeM), Malaysia)
*corresponding author

Abstract


This study proposed a classification model for timber defect classification based on an artificial neural network (ANN). Besides that, the research also focuses on determining the appropriate parameters for the neural network model in optimizing the defect identification performance, such as the number of hidden layers nodes and the number of epochs in the neural network. The neural network's performance is compared with other standard classifiers such as Naïve Bayes, K-Nearest Neighbours, and J48 Decision Tree in finding their significant differences across the multiple timber species. The classifier's performance is measured based on the F-measure due to the imbalanced dataset of the timber species. The experimental results show that the proposed classification model based on the neural network outperforms the other standard classifiers in detecting many types of defects across multiple timber species with an F-measure of 84.01%. This research demonstrates that ANN can accurately classify the defects across multiple species while defining appropriate parameters (hidden layers and epochs) for the neural network model in optimizing defect identification performance.

Keywords


Automated vision inspection; Defect identification; Neural network; Classification performance; Epoch

   

DOI

https://doi.org/10.26555/ijain.v7i2.588
      

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